Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy

• Alexander Krivcov,
• Jasmin Ehrler,
• Marc Fuhrmann,
• Tanja Junkers and
• Hildegard Möbius

Beilstein J. Nanotechnol. 2019, 10, 1056–1064, doi:10.3762/bjnano.10.106

• tip bias. Kim et al. [11] used a capacitive coupling of electrostatic force modulation to separate the magnetic from the topographic signal. In our previous paper [14], we demonstrated that Kelvin force probe microscopy (KPFM) measurements as proposed by Jaafar et al. [13] show no difference between

An NC-AFM and KPFM study of the adsorption of a triphenylene derivative on KBr(001)

• Antoine Hinaut,
• Adeline Pujol,
• Florian Chaumeton,
• David Martrou,
• André Gourdon and
• Sébastien Gauthier

Beilstein J. Nanotechnol. 2012, 3, 221–229, doi:10.3762/bjnano.3.25

• strong intermolecular interaction due to π-stacking. Keywords: atomic force microscopy; insulating surfaces; Kelvin force probe microscopy; molecular adsorption; Introduction The study of molecular adsorption on atomically clean, well-defined surfaces of bulk insulators is progressing rapidly due to